By Andreas Kerber, Eduard Cartier (auth.), Tibor Grasser (eds.)
This e-book offers a single-source connection with one of many more difficult reliability concerns plaguing sleek semiconductor applied sciences, unfavorable bias temperature instability. Readers will take advantage of state-of-the artwork assurance of study in issues similar to time based disorder spectroscopy, anomalous illness habit, stochastic modeling with extra metastable states, multiphonon thought, compact modeling with RC ladders and implications on equipment reliability and lifetime.
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